Part 2 of a two-part series, 2 days
This 2-day workshop is the second of a two-part series on Statistical Process Control. It builds on the concepts from the introductory course on SPC. Participants will leave with the knowledge and skills to apply SPC tools to diverse process situations required to effectively control and manage them. They will learn about means (Xbar) charts for variable data and about P, nP, C and U charts for attribute data, moving average (MA) and powerful exponentially weighted moving averages (EWMA) charts for both. They will also learn how to conduct studies to assess the capability of a process to meet requirements for attribute data like the number of defects (for manufacturing processes) or errors (for administrative or service processes) and the proportion defective (for manufacturing processes) or acceptable (for administrative or service processes.)
Day 1
Process Control Charts for Means & Ranges
- Review of basic stats and statistical process control concepts
- The importance of assumptions, on the distributions and patterns of common cause variations, and how to identify them
- Benefits of working with averages for process control — the central limit theorem
- Control charts for plotting averages (means) and ranges
Day 2
Choosing the Right Charts & Sampling Procedures, Attribute Charts
- When to use and not use means charts and solutions
- Data types — variable data vs. discrete or attribute data
- Control charts for attribute data as well as when and why to use the four types — P, nP for defectives and U, C for defects or errors
- Process capability for attribute data
- Summary of when to use what control chart, the role of each, how to sample and treat data
- Developing and implementing effective process control and improvement strategy and plans
Who Should Attend?
- People working with manufacturing or non-manufacturing processes
- Manufacturing, process and quality managers, and engineers
- Product and process development and design engineers
- Continual improvement and process excellence program managers
- Participants in process and quality improvement teams
- SPC coordinators
- Six Sigma practitioners
Additional Course Notes
This workshop is comprehensive. The application of SPC is often more challenging that initially meets the eye. The depth of the topics covered in this workshop will prepare you to not only manage the challenge but also look forward to it.
Prerequisites
A background in basic statistical concepts, as covered in the workshop “Intro to Statistical Methods”, is important to the understanding and application of concepts covered in this workshop.
Credit & Follow-Up
Suggested follow-up workshops include: “Design and Analysis of Experiments for Continual Improvement”, “Failure Modes and Effects (FMEA)”, and “Measurement System Analysis (MSA)”.